Optimal use of resources

Moisture measurement

Control processes

Sheet resistance measurement

Measuring ultra-thin layers

Correct dosing of gases

Thin film analysis

The TFA device utilizes broadband reflection and/or transmission characteristics to determine a wide variety of sample parameters such as film thickness (ranging from 10nm - 10µm), moisture content, sheet resistance, color, and index of refraction. The TFA device is available for in-line, process control applications and operates in vacuum and harsh environments.

Our TFAs for laboratory applications are identical in construction to our process control TFA solutions easing a move from the laboratory (lab) to the field (line).