m·u·t‘s layer thickness kit is ideally suited for material characterization and monitoring of coatings of up to three layers. The system is an off-the-shelf solution, it is easy to install and provides results extraordinarily quick which are important for industrial applications such as process control and QA measurements. The operator is guided through the measurement process which takes only a few steps. The thickness of all detected layers is displayed clearly in the window of the plug-in software. The layer thickness is calculated based on the waveform.

The m·u·t layer thickness kit allows fast, precise and accurate layer thickness measurement. The system is able to measure transparent or clear-transparent layers with a thickness of 0.1 µm to 20 µm on clear or intensely reflective base material. Contactless measurement is provided by an implemented PTFE protection ring. The layer thickness software is designed for the measurement of clear or clear-transparent layers on clear or intensely reflective base materials. The user-friendly design of the software allows

• Full control of the measurement equipment
• Guidance through the measurement procedures
• Calculation of layer thickness
• Display of last result and storing of measurement history

The layer measurement kit is available with the desktop spectrometer TRISTAN® light exUV/VIS (200 - 850 nm), or the compact mobile spectrometer with integrated computer and touch screen display TRISTAN® 5 exUV/VIS (200 - 850 nm). The measuring table for convenient measuring procedures and reproducibility of results is available as an option.